Multilayer Ceramic Chip Capacitor

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1 .. Features -Wide capacitance range, extremely compost size -Low inductance of capacitor for high frequency application -Excellent solderability and resistance to soldering heat, suitable for flow and reflow soldering -Adaptable to high-speed surface mount assembly -Conform to EIAJ-RC3402, and also compatible with EIA-RS198 and IEC PUB Construction Ceramic Material 3 Termination: 2 Inner Electrodes NPO: Ag/Ni/Sn dielectric X7R, Y5V, X5R: Cu/Ni/Sn dielectric 1 Dimensions MC / MCHL / MCRF Type Unit: mm Type Size (Inch) L W T / Symbol M B Packaging (7 Reel) Paper tape Plastic tape 0.6± ± ± ±0.05 #2 0.3±0.05 #2 0.3±0.05 #2 0.15±0.05 L 15K - 0.6±0.09 #3 0.3±0.09 #3 0.3±0.09 # / ±0.05 N 1.00± ± /-0.05 Q / ± ± ±0.20 E 10K ± ± ±010 S 0.50±010 H / / ±0.15 4K / ±0.20 #1 0.80±0.20 #1 0.80±020 #1 X 0.50±0.10 H ±0.15 A 4K 2.00± ± ±0.10 B 0.50± ±0.10 D - 3K 2.00± ± ±0.10 T 4K ±0.20 I - 3K 0.80±0.10 B 4K ± ±0.10 C - 3K 1.60± ±0.10 D - 3K 0.60± ±0.15 J - 3K (0.50±0.25)*** 3.20± ±0.20 G - 2K 1.60± ±0.10 T 4K / / / -0.1 P - 2K 0.95±0.10 C - 3K 3.20± ± ±0.10 T - 3K 1.25±0.10 D - 3K 0.75± ±0.20 G - 2K 3.20± ± ±0.20 K - 1K 2.50±0.30 M - 1K 1.25±0.10 D - 2K 4.50± ±0.15 F 0.75±0.25-2K 2.03±0.25 ( /-0.3)** 1.60±0.20 G (0.50±0.25)*** - 2K 2.00±0.20 K - 1K 1 Revision: 29-Jul-2016

2 Type Size (Inch) Unit: mm Packaging (7 Reel) L W T / Symbol M B Paper tape Plastic tape 1.25±0.10 D - 1K 3.20± ±0.20 G - 1K 4.50± ± ±0.20 K - 1K ( /-0.3)** (0.50±0.25)*** 2.50±0.30 M - 0.5K 3.20± ±0.30 U - 0.5K ** For 1808/1812: 200~3KV, ***For 1206:1KV~3KV; 1808/1812: 200~3KV #1: For 0603 Cap 10uF or 0603 Cap 4.7uF( 6.3V) or 0603 Cap>1uF(>10V)products; #2: For 0201/Cap 0.68uF products; #3: For 0201/Cap 1uF products Low Inductance Capacitors for MCLI Type Type Size (Inch) L W T / Symbol Ta min. Tb min. Unit: mm Packaging (7 Reel) Paper tape Plastic tape MCLI ± ± ±0.10 B K - Part Numbering MC 03 J T N 250 3R9 Product Type MC : General; Ultra-small Middle and High Voltage MCHL: High Q and Low ESR MCRF: Ultra High Q and Low ESR (RF) MCLI: Low Inductance Dimensions (L W) 01: : : : : : : : : 0612 Capacitance Tolerance B: ±0.1pF (Cap 5pF) C: ±0.25pF (Cap 5pF) D: ±0.5pF (5pF<Cap<10pF) F: ±1% G: ±2% J: ±5% K: ± M: ±20% Z: +80/-20% Packaging Dielectric Voltage (VDCW) T: Taping Reel N: NPO (COG) B: X7R F: Y5V X: X5R 6V3: 6.3V 250: 25V 500: 50V 101: 100V 102: 1000V 202: 2000V 302: 3000V Capacitance 3R9: 3.9pF 150: 15pF 181: 180pF 225: 2.2µF 476: 47µF 107: 100µF 2 Revision: 29-Jul-2016

3 High Q and Low ESR Capacitors for MCHL Series Capacitance & Voltage Dielectric EIA Size Code VDCW 25V 50V 100V 25V 50V 100V 50V 100V 200V 250V 500V 630V 0R5 0.5pF N^ N^ N^ N^ S^ S^ S^ S^ B B 0R6 0.6 N^ N^ N^ N^ S^ S^ S^ S^ B B 0R7 0.7 N^ N^ N^ N^ S^ S^ S^ S^ B B 0R8 0.8 N^ N^ N^ N^ S^ S^ S^ S^ B B 0R9 0.9 N^ N^ N^ N^ S^ S^ S^ S^ B B 1R0 1.0 N^ N^ N^ N^ S^ S^ S^ S^ B B B B B B 1R2 1.2 N^ N^ N^ N^ S^ S^ S^ S^ B B B B B B 1R5 1.5 N^ N^ N^ N^ S^ S^ S^ S^ B B B B B B 1R8 1.8 N^ N^ N^ N^ S^ S^ S^ S^ B B B B B B 2R2 2.2 N^ N^ N^ N^ S^ S^ S^ S^ B B B B B B 2R7 2.7 N^ N^ N^ N^ S^ S^ S^ S^ B B B B B B 3R3 3.3 N^ N^ N^ N^ S^ S^ S^ S^ B B B B B B 3R9 3.9 N^ N^ N^ N^ S^ S^ S^ S^ B B B B B B 4R7 4.7 N^ N^ N^ N^ S^ S^ S^ S^ B B B B B B 5R6 5.6 N^ N^ N^ N^ S^ S^ S^ S^ B B B B B B 6R8 6.8 N^ N^ N^ N^ S^ S^ S^ S^ B B B B B B 8R2 8.2 N^ N^ N^ N^ S^ S^ S^ S^ B B B B B B N N N N S S S S B B B B B B N N N N S S S S B B B B B B N N N N S S S S B B B B B B N N N N S S S S B B B B B B N N N N S S S S B B B B B B N N N N S S S S B B B B B B N N N N S S S S B B B B B B N N N N S S S S B B B B B B N N N N S S S S B B B B B B N N N N S S S S B B B B B B N N N N S S S S B B B B B B N N N N S S S S B B B B B B N N N N S S S S B B B B B B N N N N S S S S D D D D D D N N N N S S S S D D D D D D N N N N S S S S D D D D N N N N S S S S D D D D N N N S S S S D D D D N N N S S S S D D D D N N N S S S S D D D D N N N S S S S S S S S S S S S S S S S S S S S X X X X X X X X X X X X X X X X X X The letter in cell is expressed the symbol of product thickness The ^ mark is expressed product with Ag/Ni/Sn terminations NPO 12 Revision: 29-Jul-2016

4 Electrical Data Dielectric NPO Size 0402, 0603,0805 Capacitance* 0402: 0.5pF ~ 470pF 0603: 0.5pF ~ 3300pF 0805: 0.5pF ~ 390pF Capacitance tolerance Rated voltage (VDCW) Q * Insulation resistance at Ur Operating temperature Capacitance change Termination Cap 5pF: B(±0.1pF), C(±0.25pF) 5pF<Cap<10pF: C(±0.25pF), D(±0.50pF) Cap 10pF: J(±5%), 25V, 50V, 100V, 200V, 250V, 500V, 630V Cap<30pF: Q C Cap 30pF: Q GΩ or RxC 100Ω-F whichever is smaller -55 to +125 C ±30 ppm Ni/Sn (lead-free termination) * Measured at the conditions of 25 C ambient temperature and 30~70% related humidity Apply 1.0±0.2Vrms, 1.0MHz± for Cap 1000pF; 1.0KHz± for Cap>1000pF Electrical characteristics 13 Revision: 29-Jul-2016

5 Environmental Characteristics Size 0402, 0603, 0805, 1206, 1210, 1812 Dielectric NP0 X7R X5R Y5V Capacitance* 0.1pF~0.1µF 100pF~47µF 27nF~100µF 10nF~100µF Capacitance tolerance Cap 5pF: B (±0.1pF), C (±0.25pF) 5pF<Cap<10pF: C (±0.25pF), D (±0.50pF) Cap 10pF: J (±5%) J (± 5%) K (±) Rated voltage (VDCW) 10V,, 25V, 50V, 100V 6.3V, 10V,, 25V, 35V, 50V, 100V M (±20%) Z (-20 / +80%) Q* Cap<30pF: Q C Cap 30pF: Q 1000 Note 1 Insulation resistance at Ur** 10GΩ or R C 500Ω F Whichever is less Operating temperature -55 to +125 C -55 to 85 C -25 to +85 C Capacitance change ±30 ppm ± +30/-80% Termination Ni/Sn (lead-free termination) * Measured at the condition of 30~70% related humidity NP0: Apply 1.0±0.2Vrms, 1.0MHz± for Cap 1000pF and 1.0± 0.2Vrms, 1.0 KHz± for Cap>1000pF, 25 C ambient temperature X7R: Apply 1.0±0.2Vrms, 1.0KHz± at the condition of 25 C ambient temperature Y5V: Apply 1.0±0.2Vrms, 1.0 KHz± at the condition of 20 C ambient temperature Note 1: X7R / X5R Rated Vol. D.F. Exception of D.F. 100V 2.5% 50V 2.5% 3% µF 5% 0805>0.1µF; µF 1206>1µF; µF 0805>0.22µF; µF 3% 0201(50V); µF; µF; µF 5% uF; µF µF;0603>0.1µF; µF; µF; µF 35V 3.5% µF; µF; µF; µF 25V 3.5% 3.5% 10V 5.0% 6.3V Y5V 5% µF;0805 1µF; µF 7% µF; µF µF; µF; µF; µF; µF ; µF 12.5% µF 5% µF; µF; µF; µF; µF; µF uF(0201/X7R 0.022µF); uF; 0603 ; µF; µF µF; µF(0402/X7R 0.22µF); µF; µF; µF; µF µF µF;0402 1µF; µF; µF; µF : µF 20% µF Rated vol. D.F. Exception of D.F. 50V 5% 7% 12.5% 35V 7% V 5% (C<1.0µF) (C 1.0µF) 7% 7% µF; µF; µF µF µF; µF; µF; µF; µF 9% µF; µF; µF; µF 9% 12.5% µF; µF µF 9% 12.5% µF; µF; µF; µF; µF 10V 12.5% 20% µF 6.3V 20% Revision: 29-Jul-2016

6 Environmental Characteristics Item Requirement Test Method External Appearance Capacitance(Cap.) Dissipation Factor (D.F.) or Quality factor (Q=1/D.F.) No defects which may affect performance Visual inspection & Dimension Within the specified tolerance that refers on page2 NPO: Cap 30pF, Q 1000; Cap<30pF, Q C X7R, X5R: Rated vol. D.F. Exception of D.F. 3% µF 100V 2.5% 5% µF; µF 1206>1µF; µF 0805>0.22µF; µF 3% 0201(50V); µF µF; µF 50V 2.5% 5% uF; µF µF;0603>0.1µF; µF; µF; µF 35V 3.5% µF; µF; µF; µF 25V 3.5% 3.5% 10V 5% 6.3V Y5V: 5% µF; µF; µF 7% µF; µF µF; µF; µF µF; µF; µF 12.5% µF 5% µF; µF; µF; µF; µF; µF µF(0201/X7R 0.022µF); µF; µF; µF; µF; µF µF; µF(0402/X7R 0.22µF) µF; µF µF; µF µF; µF µF; µF µF; µF µF; µF 20% µF Rated vol. D.F. Exception of D.F. measurement NPO: (Class I) Cap 1000pF 1.0±0.2Vrms, 1MHz± Cap>1000pF 1.0±0.2Vrms, 1KHz± X7R, X5R, Y5V: (Class II) Cap 10uF 1.0±0.2Vrms, 1KHz±** Cap>10uF 0.5±0.2Vrms, 120Hz± ** Test condition: 0.5±0.2Vrms, 1KHz± X7R: 0805=106(6.3V,10V), 0603/475(6.3V) X5R: (6.3V,10V,)# (6.3V,), (10V) 0603=106 (6.3V,10V), #1 Excluding X5R/0201/105(6.3V);225(10V), (1.0±0.2Vrms,1KHz±) *Before initial measurement (Class II only): To apply de-aging at 150 C for 1hr then set for 24±2 hrs at room temp. Dielectric Strength 50V 5% 7% µF; µF; uF 12.5% µF 35V 7% 25V 5% (C<1.0µF) (C 1.0µF) 7% 7% 9% 9% 12.5% µF; µF µF; µF µF µF; µF µF; µF 9% µF; µF 12.5% µF µF; µF µF; µF µF 10V 12.5% 20% µF 6.3V 20% - - No evidence of damage or flash over during test To apply voltage( 100V) 250% Duration: 1 to 5sec Charge and discharge current less than 50mA To apply voltage: 200V~300V 2 time VDC 500V~999V 1.5 time VDC 1000V~3000V 1.2 time VDC Cut-off, set at 10mA TEST=15 sec. RAMP=0 17 Revision: 29-Jul-2016

7 Item Requirement Test Method Insulation Resistance 10GΩ or R C 500Ω-F Whichever is smaller X7R, X5R, Y5V: Rated Voltage 100V: X7R 50V: 0402>0.01µF;0603 1µF;0805 1µF; µF; µF 35V: µF; µF; µF 25V: uF; uF; uF uF; uF : µF, µF;0603 1µF; µF; µF; µF Insulation Resistance 10GΩ or RxC 100Ω-F Whichever is smaller To apply rated voltage for max. 120sec *Before initial measurement (Class II only): To apply de-aging at 150 C for 1hr then set for 24±2 hrs at room temp. 10V: nF; uF; uF uF; uF; uF 6.3V 10GΩ or 100Ω -F whichever is smaller Rated voltage: 200V~630V To apply rated voltage(500v max.) for 60sec. 10GΩ Rated voltage: >630V To apply 500V for 60sec. Temperature Characteristic of Capacitance T.C. Capacitance Change NPO ±30 (ppm/ C) X7R ± X5R ± Y5V +30%~-80% With no electrical load. T.C. Operating Temp NPO -55 ~ 125 at 25 X7R -55 ~ 125 at 25 X5R -55 ~ 85 at 25 Y5V -25 ~ 85 at 20 *Before initial measurement (Class II only): To apply de-aging at 150 C for 1hr then set for 24±2 hrs at room temp. * Measurement voltage for Class II: Cap<0.1µF:1V Cap<1µF: 1V 0.1µF Cap<1µF: 0.2V Cap=1µF: 0.5V Cap 1µF: 0.1V 1µF<Cap<10µF: 0.2V Cap 10µF: 0.1V Cap 1µF: 1V Cap<10µF: 1V 1µF<Cap 4.7µF: 0.5V Cap=10µF: 0.5V Cap>4.7µF: 0.2V Cap>10µF: 0.2V Cap 10µF: 1V Cap 10µF: 1V 10µF<Cap 100µF: 0.5V 10µF<Cap 100µF: 0.5V Cap>100µF: 0.2V Cap>100µF: 0.2V Adhesive Strength of Termination Vibration Resistance Solderability No remarkable damage or removal of the terminations No remarkable damage Cap change and Q/D.F.: To meet initial spec 95% min. coverage of all metalized area. Pressurizing force: 0201:2N 0402&0603:5N>0603:10N Test time: 10±1 sec Vibration frequency: 10~55Hz/min Total amplitude: 1.5mm Test time: 6hrs.(two hrs each in three mutually Perpendicular directions.) *Before initial measurement (Class II only): To apply de-aging at 150 C for 1hr then set for 24±2 hrs at room temp. *Cap./DF(Q) Measurement to be made after de-aging at 150 C for 1hr then set for 24±2 hrs at room temp. Solder temperature: 235±5 Dipping time: 2±0.5 sec. 18 Revision: 29-Jul-2016

8 Bending Test Resistance to Soldering Heat Item Requirement Test Method Temperature Cycle No remarkable damage. Cap change: NP0: within ±5% or 0.5pF whichever is larger X7R, X5R, X6S, X7S: within ±12.5% Y5V: within ±30% (This capacitance change means the change of capacitance under specified flexure of substrate from the capacitance measured before the test.) No remarkable damage. Cap change: NP0: within ±2.5% or 0.25pF whichever is larger X7R, X5R, X6S, X7S: within ±7.5% Y5V: within ±20% Q/D.F., I.R. and dielectric strength: To meet initial requirements. 25% max. leaching on each edge No remarkable damage. * Cap change: NP0: within ±2.5% or 0.25pF whichever is larger X7R, X5R, X6S, X7S: within ±7.5% Y5V: within ±20% * Q/D.F., I.R. and dielectric strength: To meet initial requirements The middle part of substrate shall be pressurized by means of the pressurizing rod at a rate of about 1 mm per second until the deflection becomes 1 mm and then the pressure shall be maintained for 5±1 sec. *Before initial measurement (Class II only): To apply de-aging at 150 C for 1hr then set for 24±2 hrs at room temp. Measurement to be made after keeping at room temp. for 24±2 hrs. Solder temperature: 260±5 C Dipping time: 10±1 sec Preheating: 120 to 150 C for 1 minute before immerse the capacitor in a eutectic solder. *Before initial measurement (Class II only): To apply de-aging at 150 C for 1hr then set for 24±2 hrs at room temp. Cap. / DF(Q) / I.R. Measurement to be made after de-aging at 150 C for 1hr then set for 24±2 hrs at room temp Conduct the five cycles according to the temperature and time. Step Temp.( ) Time(min) 1 Min. operating temp.+0/-3 30±3 2 Room temp Max. operating temp.+3/-0 30±3 4 Room temp. 2-3 Before initial measurement (Class II only): To apply de-aging at 150 C for 1hr then set for 24±2 hrs at room temp. Cap. / DF(Q) / I.R. Measurement to be made after de-aging at 150 C for 1hr then set for 24±2 hrs at room temp. 19 Revision: 29-Jul-2016

9 Item Requirement Test Method Humidity (steady state) No remarkable damage. Cap change: NP0: within ±5% or 0.5pF whichever is larger X7R, X5R: 10V**,within ±12.5%; 6.3V within ±25%;C 1uF,within ±25% **10V: µF;0402 1µF; µF, within ±25%; Y5V: 10V, within ±30%; 6.3V, within +30/-40% Q/D.F. value: NP0: More than 30pF Q 350, 10pF C 30pF, Q C Less than 10pF Q C X7R, X5R: Rated vol. D.F. 100V 3% Exception of D.F. 6% µF 7.5% µF; 0805>0.1µF;1206>1µF; µF 20% 0805>0.22µF; µF 6% 0201(50V); µF; µF; µF 50V 3% uF; µF 20% µF;0603>0.1µF;0805 1µF; µF; µF 35V 5% 20% µF; µF; µF; µF 25V 5% 5% 10V 7.5% µF; µF; µF 14% µF; µF µF; µF; µF µF; µF; µF 20% µF µF; µF; µF; µF 6.3V 30% Y5V: µF(0201/X7R 0.022µF); µF; µF; µF; µF; µF µF; µF(0402/X7R 0.22µF) µF; µF; µF; µF 20% µF; µF Rated vol. D.F. Exception of D.F. 50V 7.5% µF; µF; µF; µF µF; µF µF; µF; uF 20% µF 35V 25V 7.5% (C<1.0µF) (C 1.0µF) 12.5% 20% µF; µF; µF; µF; µF µF; µF; µF; µF 12.5% µF; µF 20% µF 10V 20% 30% µF 6.3V 30% µF; µF; µF; µF; µF Test temp.: 40±2 C Humidity: 90~95%RH Test time: /-0hrs. Before initial measurement (Class II only): To apply de-aging at 150 C for 1hr then set for 24±2 hrs at room temp. Cap. / DF(Q) / I.R. Measurement to be made after de-aging at 150 C for 1hr then set for 24±2 hrs at room temp. I.R.: 10V, 1GΩ or 50 Ω-F whichever is smaller. Class II (X7R, X5R,Y5V) Rated Voltage 100V: X7R 50V: 0402>0.01µF;0603 1µF;0805 1µF; µF; µF 35V: µF; µF; µF; µF 25V: uF; µF; µF; µF; µF; µF : µF, µF;0603 1µF; µF; µF; µF 10V: nF; uF; uF uF; uF; uF 6.3V Insulation Resistance 10GΩ or RxC 10Ω-F Whichever is smaller 20 Revision: 29-Jul-2016

10 Humidity load Item Requirement Test Method No remarkable damage. Cap change: NP0: ±7.5% or 0.75pF whichever is larger. X7R, X5R, X6S, X7S: 10V**,within ±12.5%; 6.3V within ±25%; TT series & C 1uF,within ±25% **10V: µF;0402 1µF; µF, within ±25%; Y5V: 10V, within ±30%; 6.3V, within +30/-40% Q/D.F. value: NP0: C 30pF,Q 200;C<30pF, Q /3C X7R, X5R: Rated vol. D.F. 100V 3% Exception of D.F. 6% µF 7.5% µF; 0805>0.1µF;1206>1µF; µF 20% 0805>0.22µF; µF 6% 0201(50V); µF; µF; µF 50V 3% uF; µF 20% µF;0603>0.1µF;0805 1µF; µF; µF 35V 5% 20% µF; µF; µF; µF 25V 5% 5% 10V 7.5% µF; µF; µF 14% µF; µF µF; µF; µF µF; µF; µF 20% µF µF; µF; µF; µF 6.3V 30% Y5V: µF(0201/X7R 0.022µF); µF; µF; µF; µF; µF µF; µF(0402/X7R 0.22µF) µF; µF; µF; µF 20% µF; µF Rated vol. D.F. Exception of D.F. 50V 7.5% µF; µF; µF; µF µF; µF µF; µF; uF 20% µF 35V 25V 7.5% (C<1.0µF) (C 1.0µF) 12.5% 20% µF; µF; µF; µF; µF µF; µF; µF; µF 12.5% µF; µF 20% µF 10V 20% 30% µF 6.3V 30% µF; µF; µF; µF; µF Test temp.:40±2 C Humidity:90~95%RH Test time:500+24/-0 hrs. To apply voltage: Rated voltage (MAX. 500V) Before initial measurement (Class II only): To apply de-aging at 150 C for 1hr then set for 24±2 hrs at room temp. Cap. / DF(Q) / I.R. Measurement to be made after de-aging at 150 C for 1hr then set for 24±2 hrs at room temp. I.R.: 10V, 500MΩ or 25 Ω-F whichever is smaller. Class II (X7R, X5R,Y5V) Rated Voltage 100V: X7R 50V: 0402>0.01µF;0603 1µF;0805 1µF; µF; µF 35V: µF; µF; µF; µF 25V: uF; µF; µF; µF; µF; µF : µF, µF;0603 1µF; µF; µF; µF 10V: nF; uF; uF uF; uF; uF 6.3V Insulation Resistance 500MΩ or RxC 5Ω-F Whichever is smaller 21 Revision: 29-Jul-2016

11 Item Requirement Test Method High Temperature Load (Endurance) No remarkable damage. Cap change: NP0: ±3.0% or ±0.3pF whichever is larger X7R, X5R, X6S, X7S: 10V**,within ±12.5%; 6.3V within ±25%; TT series & C 1uF,within ±25% **10V: µF;0402 1µF; µF, within ±25%; Y5V: 10V, within ±30%; 6.3V, within +30/-40% Q/D.F. value: NP0: More than 30pF, Q pF C<30pF, Q C Less than 10pF, Q C X7R, X5R: Rated vol. D.F. 100V 3% Exception of D.F. 6% µF 7.5% µF; 0805>0.1µF;1206>1µF; µF 20% 0805>0.22µF; µF 6% 0201(50V); µF; µF; µF 50V 3% uF; µF 20% µF;0603>0.1µF;0805 1µF; µF; µF 35V 5% 20% µF; µF; µF; µF 25V 5% 5% 10V 7.5% µF; µF; µF 14% µF; µF µF; µF; µF µF; µF; µF 20% µF µF; µF; µF; µF 6.3V 30% Y5V: µF(0201/X7R 0.022µF); µF; µF; µF; µF; µF µF; µF(0402/X7R 0.22µF) µF; µF; µF; µF 20% µF; µF Rated vol. D.F. Exception of D.F. 50V 7.5% µF; µF; µF; µF µF; µF µF; µF; uF 20% µF 35V 25V 7.5% (C<1.0µF) (C 1.0µF) 12.5% 20% µF; µF; µF; µF; µF µF; µF; µF; µF 12.5% µF; µF 20% µF 10V 20% 30% µF 6.3V 30% µF; µF; µF; µF; µF Test temp.: NP0, X7R: 125±3 C X5R, Y5V: 85±3 C To apply voltage: (1) 6.3V or C 10µF : 150% of rated voltage. (2) 10V Ur<500V: 200% of rated voltage. (3) 500V: 150% of rated voltage. (4) Ur 630V: 120% of rated voltage. (5) 100% of rated voltage for below range. Size Dielectric 0201 X5R,X7R 0402 X5R,X7R, Y5V 0603 X5R,X7R 0805 X5R,X7R 1206 Rated voltage Capacitance range 10V C 0.1uF C>0.1µF 6.3V,10V,25V C 1.0uF 6.3V,10V C 4.7uF 25V,35V C 1.0uF 6.3V C 22uF 10V~50V C 10uF X5R,X7R 6.3V C 47uF NPO 3000V C 1.5pF X5R,X7R C 47uF 1210 X7R 100V C 3.3uF (6) 150% of rated voltage for below range Size Dielectric Rated voltage Capacitance range X5R,X7R,25V C 0.1uF X7R C>0.022µF X5R,X7R, 50V C 1.0uF 10~25V C 0.022uF Y5V C 0.47uF X7R 50V C 0.1uF X5R,X7R, 10V,,50V C 1.0uF Y5V C 2.2uF X5R,X7R 10V~50V C 4.7uF X5R,X7R 50V 100V C 2.2uF C 0.47uF Y5V C 4.7uF 1206 X5R,X7R 100V C 1.0uF 1210 X5R,X7R 50V~100V C 2.2uF I.R.: 10V, 1GΩ or 50 Ω-F whichever is smaller. Class II (X7R, X5R,Y5V) Rated Voltage 100V: X7R 50V: 0402>0.01µF;0603 1µF;0805 1µF; µF; µF 35V: µF; µF; µF; µF 25V: uF; µF; µF; µF; µF; µF : µF, µF;0603 1µF; µF; µF; µF 10V: nF; uF; uF uF; uF; uF 6.3V Insulation Resistance 500MΩ or RxC 5Ω-F Whichever is smaller 22 Revision: 29-Jul-2016

12 Packaging Packaging Quantity Unit: mm Type Thickness / Symbol Packaging (7 Reel) Paper tape Plastic tape 0.30±0.03 L 15K ±0.05 L 15K ±0.09 L 15K ±0.05 N 10K /-0.05 Q 10K ±0.20 E 10K ±0.10 H 4K ±0.10 S 4K / X 4K ±0.10 H 4K ±0.10 A 4K ±0.10 B 4K ±0.10 T 4K ±0.10 D - 3K 1.25±0.20 I - 3K 0.80±0.10 B 4K ±0.10 T 4K ±0.10 C - 3K ±0.15 J - 3K 1.25±0.10 D - 3K 1.60±0.20 G - 2K / P - 2K 0.85±0.10 T - 3K 0.95±0.10 C - 3K ±0.10 D - 3K 1.60±0.20 G - 2K 2.00±0.20 K - 1K 2.50±0.30 M - 1K 1.25±0.10 D - 2K ±0.15 F - 2K 1.60±0.20 G - 2K 2.00±0.20 K - 1K 1.25±0.10 D - 1K 1.60±0.20 G - 1K ±0.20 K - 1K 2.50±0.30 M - 0.5K 2.80±0.30 U - 0.5K ±0.10 B 4K - Tape and Reel Unit: mm Chip Size Type / ΦC 13.0± ± ± ± ± ± ± ±1.0 W 9.0± ± ± ± ± ± ± ±1.0 ΦA 178±1.0(7 ) 178±1.0(7 ) 178±1.0(7 ) 178±1.0(7 ) 178±1.0(7 ) 178±1.0(7 ) 178±1.0(7 ) 178±1.0(7 ) ΦB 60.5±1.0(7 ) 60.5±1.0(7 ) 60.5±1.0(7 ) 60.5±1.0(7 ) 60.5±1.0(7 ) 60.5±1.0(7 ) 80.0±1.0(7 ) 80.0±1.0(7 ) 23 Revision: 29-Jul-2016

13 Plastic Tape Size Specification Unit: mm Type Thickness D I C J D G P T C D G K M D F G K D F G K M U A 0 <1.80 <200 <2.30 <3.05 <3.05 <3.20 <2.50 <3.90 B 0 <2.70 <3.70 <4.00 <3.80 <3.80 <3.95 <5.30 <5.30 T 0.23± ± ± ± ± ± ± ±0.10 K 0 <2.50 <2.50 <2.50 <1.50 <2.50 <3.00 <2.50 <2.50 <3.50 W 8.00± ± ± ± ± ± ± ±0.20 P ± ± ± ± ± ± ± ±0.10 P ± ± ± ± ± ± ± ±0.10 P ± ± ± ± ± ± ± ±0.05 D / ± / / / / / /-0 D ± ± ± ± ± ± ± ±0.10 E 1.75± ± ± ± ± ± ± ±0.10 F 3.50± ± ± ± ± ± ± ±0.10 Paper Tape Size Specification Type /0612 Thickness L N E S H X A H B T B T A ± ± ± ± ± ±0.50 B ± ± ± ± ± ±0.50 T W 8.00± ± ± ± ± ±0.10 P ± ± ± ± ± ±0.10 P ± ± ± ± ± ±0.10 P ± ± ± ± ± ±0.05 D ± ± ± ± ± ±0.05 E 1.75± ± ± ± ± ±0.10 F 3.50± ± ± ± ± ±0.05 Unit: mm 24 Revision: 29-Jul-2016

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