Measurement of Internal Strain in Materials Using High Energy Synchrotron Radiation White X-Rays

Μέγεθος: px

Εμφάνιση ξεκινά από τη σελίδα:

Download "Measurement of Internal Strain in Materials Using High Energy Synchrotron Radiation White X-Rays"

Ὅμηρος Μεσσηνέζης
5 χρόνια πριν
Προβολές:

1 (Journal of the Society of Materials Science, Japan), Vol. 56, No. 10, pp , Oct X Measurement of Internal Strain in Materials Using High Energy Synchrotron Radiation White X-Rays by Jun-ichi SHIBANO, Takahisa SHOBU, Kenji SUZUKI, Tomoyuki HIRATA, Hiroshi KANEKO and Michiaki KOBAYASHI This paper presents a basic research on a measurement of strain in the bulk of materials by using high energy white X-rays from a synchrotron radiation source of SPring-8. WEL-TEN780E JIS G3128 SHY685 whose grain size was 13μm was used as a specimen shaped into G type. The specimen was loaded with bending. The white X-ray beam, which has a height of 50μm and width of 300μm, was incident in the specimen with the Bragg angle θ of 5degree. Bending strain at the surface of specimen was measured by a strain gauge. The strain in the loading direction of the specimen was obtained directly from a rate of change of peak energy of transmitted X-rays through the thickness. As a result, the internal strain of SHY685 of 5mm thickness could be evaluated using white X-rays which range of energy from 60keV to 150keV. It is suitable for the measurement with sufficient accuracy to include more than or equal to 5000 grains of crystal in the gauge volume. The measurement error of strain could be decreased by using the diffracted X-rays with high energy. Furthermore, the measurement with a high degree of accuracy was accomplished using α Fe321 diffraction in this material. The results showed that the high energy white X-ray is effective for internal strain measurements. Key words : Strain measurement, High energy synchrotron radiation X-rays, Internal strain, Energy dispersive method 1 1) 4) 5) 7) 10 8) 16) mm μm 3 (SPring-8) 28.9keV Received Jan. 25, The Society of Materials Science, Japan Dept. of Mech. Eng., Kitami Inst. of Tech., Kouen-cho, Kitami, Synchrotron Radiation Res. Unit., Japan Atomic Energy Agency, Sayo-gun, Hyogo, Dept. of Tech. and Living Sci., Niigata Univ., Igarashi-2-no-cho, Niigata, Dept. of Mech. Eng., Kitami Inst. of Tech., Kouen-cho, Kitami, Synchrotron Radiation Res. Unit., Japan Atomic Energy Agency, Sayo-gun, Hyogo,

986 SPring-8 BL14B1 2 d 0 d (1) d d0 ε = (1) d0 d 2θ (2) d = λ (2) 2 sinθ λ λ (nm) E (kev) (3) λ = 1. 2398 (3) E (3) (2) d = 1.

1 Experimental setup using white X-ray at BL14B1. Table 1 X-ray conditions for stress measurement by synchrotron radiation at BL14B1.

2 986 SPring-8 BL14B1 2 d 0 d (1) d d0 ε = (1) d0 d 2θ (2) d = λ (2) 2 sinθ λ λ (nm) E (kev) (3) λ = (3) E (3) (2) d = (4) 2E sinθ 2θ (4) (1) (5) d d0 En0 En ε = = (5) d0 En E n0 E n SPring-8 BL14B1 17) 1 2 XAFS 1 Fig. 1 Table 1 2 HUBER 2 2θ 50μm 5mm 150mm Ge Fig. 1 Experimental setup using white X-ray at BL14B1. Table 1 X-ray conditions for stress measurement by synchrotron radiation at BL14B1. (Ge solid state detector : SSD) 18) X-Y 3 2 SSD SSD Ge K 11.1keV Ge Kα (9.87keV) Kβ (11.0keV) SSD SSD Ge- Kα Ge-Kβ E n E α n (kev) E β n (kev) α Ge K α : En = En 987. (6) β Ge K β : En = En (7) Fig. 2 E = 78.5 kev α Fe keV

3 X 987 Table 2 Chemical composition of SHY685 (wt.%). Fig. 2 Escape peak detected by SSD. 3 3 MCA MCA (Multichannel analyzer) MCA 4096 Mo Ag Ta Pt Pb CH E n (kev) (8) En = CH (8) eV 50keV keV Fig. 2 (W-Kα1) 10eV 19) 21) W-Kα1 3 4 WEL-TEN780E (JIS G3128 SHY685) SHY685 Table 2 16mm GPa 0.29 Fig. 3 (a) mm 3 G Fig. 3 (a) 3 10mm 5mm Fig. 3 (a) M6 5% 13μm Fig. 3 (a) Fig. 3 (a) z y x z Fig. 3 Geometry of specimen and beam alignment.

4 988 Fig. 3 (b) (a) x t = 50μm θ = 5deg h 50μm b 574μm Fig. 3 (c) (a) Fig. 3 (c) Fig. 3 (c) y 3 y = 0mm z y 4mm 4mm 8mm 0.25mm Fig. 4 y = 0mm 2θ = 10deg Bragg θ = 5deg 300s mm SHY685 50keV 150keV 5mm SSD keV 4 2 y = 0mm Bragg 5deg 1500s Fig. 5 α Fe 420 (9) En En p 2 ( ) I = I0 + Aexp w 2 ln( 2) ( ) (9) I I 0 offset p A w E n E n Fig. 5 width mm count BL14B (5) kev Fig Fig. 4 Diffraction profile of SHY685 by white X-rays. Fig. 5 Diffraction X-ray intensity and energy vs slit size.

5 X Fig mm mm y = 0mm 900s Bragg θ = deg α Fe 310 Bragg θ = 3deg keV 1 1 θ = 7deg keV Bragg θ = 3deg θ = 4deg 4000 θ = 7deg Bragg θ = 6 7deg Bragg θ = 3deg Bragg θ = 3 4deg Bragg θ = 5deg 2θ = 10deg mm mm y = 0mm 2θ = 10deg 600s Fig. 6 Change of diffraction profile with diffraction angle. Fig. 7 Convergence time of measurement data.

6 990 α Fe 420 Fig. 7 (a) 7200sec α Fe Fig. 7 (b) SSD 100keV mm mm 2θ 10deg 900s 3000 Fig. 8 y = 0 ± 4mm α Fe 321 Fig. 8 (a) y Fig. 8 (b) 3 Fig. 9 α Fe 321 (9) y ± 0.1keV y E 0 Fig. 10 α Fe y y Fig. 10 α Fe 211 R Fig. 10 α Fe Fig. 10 α Fe 321 Fig. 8 Diffraction profile of α Fe 321 plane of SHY685. Fig. 9 Diffraction energy distribution of α Fe 321 plane of SHY685 with and without bending.

7 X 991 Fig. 10 Strain distributions of α Fe 211, 321, 420 and 521 planes of SHY685 under bending. α Fe α Fe 321 SSD α Fe 321 Voigt 227GPa Reuβ 220GPa Kröner 224GPa 200GPa SHY keV α Fe SPring-8 BL14B1 WEL-TEN780E (JIS G3128 SHY685) 5mm (1) keV 5mm SHY685 (2) deg (3) SHY keV α Fe 321 (C) (No )

8 992 1 ) J. Shibano, T. Ukai and S. Tadano, Measurement of residual stress distribution along the depth direction in subsurface layer by polychromatic X-rays, Journal of the Society of Materials Science, Japan, Vol.43, No.490, pp (1994). 2 ) J. Shibano, T. Ukai, S. Tadano and M. Todoh, Residual stress evaluation of austenitic stainless steel with a finished surface by polychromatic X-ray method, Transaction of the Japan Society of Mechanical Engineers, Vol.61, No.591, pp (1995). 3 ) J. Shibano, S. Tadano and T. Ukai, Polychromatic X-ray method for residual stress measurements in a subsurface layer, Experimental Mechanics, Vol.36, No.1, pp (1996). 4 ) J. Shibano, S. Tadano, M. Todoh and T. Ukai, Effect of intermediate layer on residual stress occurred in hydroxyapatite coating implant, Transactions of the Japan Society of Mechanical Engineers, Japan, Vol.65, No.639, pp (1999). 5 ) G. Brusch and W. Reimers, Evaluation of residual stresses in the surface region and in the bulk of materials by high energy X-ray diffraction, Proceedings of The Fifth International Conference on Residual Stresses, Vol.1, pp (1997). 6 ) W. Reimers, M. Broda, G. Brusch, D. Dantz, K. D. Liss, A. Pyzalla, T. Schmackers and T. Tschentscher, Evaluation of residual stresses in the bulk of materials by high energy synchrotron diffraction, Journal of Nondestructive Evaluation, Vol.17, No.3, pp (1998). 7 ) C. Stock, Ch. Genzel and W. Reimers, Residual stress analysis in the intermediate zone between surface and volume by energy dispersive X-ray diffraction Problems and attempts at their solution, Proceedings of The Six International Conference on Residual Stresses, Vol.1, pp (2000). 8 ) S. Takago, T. Sasaki, K. Akita, Y. Yoshioka and Y. Hirose, X-ray stress measurement of composite material using synchrotron radiation, Journal of the Society of Materials Science, Japan, Vol.49, No.7, pp (2000). 9 ) K. Suzuki, K. Tanaka, Y. Akiniwa, M. Kawamura, K. Nishio and H. Okado, In-situ stress measurement of bond coating at high temperature by high-energy synchrotron X-rays, Journal of the Society of Materials Science, Japan, Vol.52, No.7, pp (2003). 10) H. Suzuki, K. Akita, Y. Yoshioka, Y. Waku and H. Misawa, Evaluation of phase stresses of Al 2O 3/YAG binary MGC by synchrotron radiation, Journal of the Society of Materials Science, Japan, Vol.52, No.7, pp (2003). 11) Y. Sakaida, K. Tanaka, Y. Akiniwa and Y. Sawaki, In-situ local stress measurement near notch tip in alumina ceramics using synchrotron radiation source, Journal of the Society of Materials Science, Japan, Vol.52, No.10, pp (2003). 12) K. Tanaka, T. Ito, Y. Akiniwa and H. Ohta, In-situ synchrotron measurement of thermal stress in textured copper thin films during thermal cycling, Journal of the Society of Materials Science, Japan, Vol.53, No.7, pp (2004). 13) Y. Akiniwa, H. Kimura and K. Tanaka, Measurement of stress distribution near notch and fatigue crack in ultra-fine grained steel by synchrotron radiation, Journal of the Society of Materials Science, Japan, Vol.53, No.7, pp (2004). 14) T. Shobu, J. Mizuki, K. Suzuki, H. Suzuki, Y. Akiniwa and K. Tanaka, Application of strain scanning method to stress measurement of austenitic stainless steel, Journal of the Society of Materials Science, Japan, Vol.55, No.7, pp (2006). 15) T. Shobu, J. Mizuki, K. Suzuki, Y. Akiniwa and K. Tanaka, High space-resolutive evaluation of subsurface stress distribution by strain scanning method with analyzer using high-energy synchrotron X-rays, JSME International Journal, Series A, Vol.49, No.3, pp (2006). 16) K. Suzuki, K. Tanaka and T. Shobu, Residual stress in EB- PVD thermal barrier coatings, Material Science Forum, Vol , pp (2006). 17) L/BL14B1/index.html 18) H. Ohyanagi, Basis of synchrotron radiation, pp (1996) Maruzen. 19) T. Fukamachi, S. Hosoya and O. Terasaki, The Precision of interplanar distances measured by an energy-dispersive diffractometer, J. Appl. Cryst., Vol.6, No.117, pp (1973). 20) M. Nagao and S. Kusumoto, Poly-chromatic X-ray stress measurement, Journal of the Society of Materials Science, Japan, Vol.26, No.285, pp (1977). 21) T. Takama and S. Sato, Energy dispersive X-ray diffraction method and its application, Advancement of X-ray Analysis IX, pp (1977).

Σχετικά έγγραφα

Chapter 7 Transformations of Stress and Strain

Chapter 7 Transformations of Stress and Strain INTRODUCTION Transformation of Plane Stress Mohr s Circle for Plane Stress Application of Mohr s Circle to 3D Analsis 90 60 60 0 0 50 90 Introduction 7-1