Development of New High-Purity Alumina

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Development of New High-Purity Alumina Sumitomo Chemical Co., Ltd. Basic Chemicals Research Laboratory Shinji FUJIWARA Yasuaki TAMURA Hajime MAKI Norifumi AZUMA Yoshiaki TAKEUCHI Sumitomo s high-purity alumina has been manufactured by the method of hydrolysis of aluminum alkoxide since 1981, and the present production capacity is 1500t/Y. High-purity alumina is used in areas such as displays, energy, automobiles, semiconductors and computers and demand for it is growing steadily. In this paper, a general view of recent applications for high-purity alumina is introduced, and our newlydeveloped high-purity alumina products are also described. Al2O3 99.6 99.9 IC 99.99 1981250t/Y 2004 1500t/Y 1) 10) 11) AACH 12) 13) 14) Fig. 1 13 2007-

Al + 3ROH / Al (OR)3 + 3/2H2 (1) 2Al (OR)3 +4H2O / Al2O3 H2O + 6ROH (2) Al2O3 H2O / Al2O3 + H2O (3) Fig. 1 ROH H2O Al Metal Alkoxide Synthesis Hydrolysis Hydrated Alumina Calcination Processing High Purity Alumina Manufacturing process of High Purity Alumina by alkoxide method Boehmite γ, δ, θ- Al2O3 -Al2O3 -Al2O3 nm -Al2O3 1200 -Al2O3 -Al2O3 -Al2O3 15) 18) 18), 19) 20), 21) -Al2O3 -Al2O3 Table 1 Character of Sumitomo s high purity alumina AKP-20 AKP-30 AKP-50 AKP-3000 AKP-G008 AKP-G015 HIT-50 Crystal Form Purity (%) Particle Size (µm) Loose Bulk Density (g/cm 3 ) BET Surface Area (m 2 /g) Impurity Level Si (ppm) Na (ppm) Mg (ppm) Cu (ppm) Fe (ppm) 0.4 ~ 0.6 0.7 ~ 1.1 4 ~ 6 40 20 0.3 ~ 0.5 0.7 ~ 1.0 5 ~ 10 40 20 0.1 ~ 0.3 0.6 ~ 1.1 9 ~ 15 25 20 5 0.4 ~ 0.7 0.3 ~ 0.6 4 ~ 8 20 θ 5 < 0.1 ~ 80 ~ 8 8 γ 5 < 0.1 ~ 150 ~ 8 8 > 99.95 ~ 0.25~ 6 ~ 13 50 0 2007-

22), 23) Table 1 Fig. 2 24) In Situ Chemical Vapor Deposition -Al2O3 µm Fig. 3 (1) AKP-30 (2) AKP-3000 Fig. 3 SEM image of Sumicorundum 10µm Fig. 2 1µm 1µm (3) AKP-G015 (4) HIT-50 0.1µm 0.25µm SEM and TEM images of Sumitomo s high purity alumina 1200 -Al2O3 -Al2O3 1000 Rajendran 25) -Al2O3 950 60nm -Al2O3 (1) 70nm (2) 50nm (3) 30nm 100nm Fig. 4 TEM images of Sumitomo s nano-sized -Al2O3 powders 2007-

Krell Ma 26) 28) 0.1µm Diaspore -Al2O3 950 50nm -Al2O3 -Al2O3 -Al2O3 Fig. 4 Verneuil γ -Al2O3 EFG Edge-defined Film-fed Growth LED Light Emitting Diode 29) LED LED 30) LEDGaN 3-5 GaNGaN 31) -Al2O3 2000 Mo -Al2O3 32) 2mm AKQ-10 Czochralski 33) -Al2O3 AKQ-10 2.0g/cm 3 -Al2O3 Table 2 Fig. 5 -Al2O3 -Al2O3 Table 2 Character of -Al2O3 for sapphire single crystal Crystal Form Purity (%) Loose Bulk Density (g/cm 3 ) BET Surface Area (m 2 /g) Impurity Level Si (ppm) Na (ppm) Mg (ppm) Cu (ppm) Fe (ppm) Ca (ppm) AKQ-10 1 ~ ~ 3 ~ High Density New Alumina 2 1 (1) AKQ-10 (2) High Density New Alumina Fig. 5 1mm SEM images of -Al2O3 for sapphire single crystal 2007-

PDP Plasma Display Panel PDP 34) 147nm Xe172nm Xe VUV 254nm BaMgAl10O17 : Eu 2+ BAM PDP VUV 35) BAM Ba Mg Eu 36) 38) 39) 5 40) 41) 42) Fired Density (g/cm 3 ) 4.00 3.80 3.60 3.40 3.20 1200 1300 1400 1500 1600 Fig. 6 Powder A (particle size : 0.5µm) Powder B (particle size : 0.4µm) Powder C (particle size : 0.2µm) Powder D (particle size : 0.1µm) Temperature ( C) Sintering behavior of Sumitomo s high purity alumina powders A/F Air fuel ratio sensor A/F Fig. 7 1µm Microstructure of Powder D (MgO = 500ppm addition) sintered body at 1300 C 2007-

-Al2O3 Fig. 6 Fig. 7 -Al2O3 24) 43) -Al2O3 PETPEN 48) Fig. 8 Fe C -Al2O3 100nm 49) -Al2O3 Magnetic Recording Tape Fig. 8 Magnetic Layer Non-Magnetic Layer Base film Back coating Layer Magnetic Head Magnetic Recording System -Al2O3 Particle Magnetic Particle Binder Non-Magnetic Particle -Al2O3 1 -Al2O3 HITFig. 1 4 44) 47) -Al2O3 CMP Chemical Mechanical Polishing 2 -Al2O3 Ma 26), 27) -Al2O3 128599 -Al2O3 1250 3.95g/cm 3 99.2 2007-

3 -Al2O3 4 800 500 CH4 + H2O / 3H2 + CO (4) Fig. 9 -Al2O3 γ - Al2O3 Pore Volume (cc/g) 1.2 1.0 0.8 0.6 0.4 0.2 Fig. 10 Powder B (particle size : 0.4µm) Powder C (particle size : 0.2µm) Powder D (particle size : 0.1µm) Nano-Al2O3 (particle size : 50nm) 0.0 1 10 100 Pore Radius (nm) Pore size distribution of high purity alumina powder compacts 16nm -Al2O3 H2 separation Layer (SiO2, Zeolite) Intermediate Layer (γ-al2o3) Porous Tube (-Al2O3) Fig. 9 H2 H2, CO Structure of Hydrogen separation element γ - Al2O3 -Al2O3 -Al2O3 1/5 Krell Ma 28) -Al2O3 10 60nm 40 -Al2O3 10 100nm -Al2O3 γ -Al2O3 2 50nm30 40 -Al2O3 50) -Al2O3 Fig. 10 -Al2O3 -Al2O3 CO 1),,,, 2, 59 (1980). 2),,, 2 (5), 23 (1982). 3),,,, 58 (3), 106 (1984). 4),,,, 1984 (6), 63. 5), FC, 3 (7), 9 (1985). 6),,, 48, 173 (1985). 2007-

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PROFILE Shinji FUJIWARA Norifumi AZUMA Yasuaki TAMURA Yoshiaki TAKEUCHI Hajime MAKI 2007-