Surface Mount Multilayer Chip Capacitors for Commodity Solutions

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1 Surface Mount Multilayer Chip Capacitors for Commodity Solutions Below tables are test procedures and requirements unless specified in detail datasheet. 1) Visual and mechanical 2) Capacitance 3) Q/DF (dissipation factor) Class 1: C0G (NP0) Cap pf; 1.0 V RMS ± 0.2 V RMS ; 1 MHz ± Cap. > 1000 pf; 1.0 V RMS ± 0.2 V RMS ; 1 khz ± Class 2: X7R, X5R, Y5V Cap. 10 μf; 1.0 V RMS ± 0.2 V RMS ; 1 khz ± (1) Cap. > 10 μf; 0.5 V RMS ± 0.2 V RMS ; 120 Hz ± 20 % Note (1) Test conditions 0.5 V RMS ± 0.2 V RMS ; 1 khz ± X7R: 0603: 2.2 μf/10 V 0805: 10 μf/6.3 V and 10 V X5R: 0201: 220 nf/6.3 V 0402: 4.7 μf/6.3 V 0402: 2.2 μf/10 V 0603: 10 μf/6.3 V No remarkable defect Dimensions should confirm to individual specification sheet Shall not exceed the limits given in the detailed specification C0G (NP0): Cap. 30 pf: Q 1000 Cap. < 30 pf: Q C X5R, X7R: RATED 3 % 0201 (50 V); μf; μf; μf 50 V 2.5 % 5 % μf; μf; μf; 35 V 3.5 % μf; 5 % μf; μf; 25 V 3.5 % 7 % μf; μf μf; μf; μf; μf; μf; μf; 5 % μf; μf; 3.5 % μf; μf; μf; μf; μf; μf; μf; 10 V 5 % μf; μf; μf; μf; μf μf; μf; 6.3 V μf; μf; μf; μf 20 % μf 4 V - - Y5V: RATED 50 V 5 % 7 % μf; μf; μf 35 V 7 % % 7 % 9 % 9 % 12.5 % μf; μf; μf; μf; μf; μf; μf; 9 % μf; μf 12.5 % μf μf; μf; μf; 10 V 12.5 % 20 % μf 6.3 V 20 % - - Revision: 27-Mar-13 1 Document Number: 28545

2 4) Dielectric strength 5) Insulation resistance 6) Temperature coefficient 7) Adhesive strength of termination 8) Vibration resistance 9) Solderability To apply voltage ( 100 V) 250 % Duration: 1 s to 5 s Charge and discharge current less than 50 ma To apply voltage 200 V to 300 V 2 times V DC 500 V to 999 V 1.5 times V DC 1000 V to 3000 V 1.2 times V DC Cut-off, set at 10 ma TEST = 15 s RAMP = 0 Rated voltage 100 V: To apply rated voltage for max. 120 s Rated voltage: 200 V to 630 V Rated voltage: 630 V To apply rated voltage (500 V max.) for 60 s To apply 500 V for 60 s No evidence of damage or flash-over during test 10 G or R x C 500 F whichever is smaller Class 2 (X5R, X7R, Y5V): RATED 50 V: μf; μf; μf; 35 V: μf; 25 V: μf; μf; μf; μf; : μf; μf; μf; μf; μf 10 V: nf; μf; μf; μf; μf; μf 10 G or R x C > 100 F whichever is smaller 10 G INSULATION RESISTANCE 10 G or R x C 100 F With no electrical load: T.C. Operating Temp. T.C. Capacitance change C0G (NP0) - 55 C to 125 C at 25 C C0G (NP0) Within ± 30 ppm/ C X7R - 55 C to 125 C at 25 C X7R Within ± X5R - 55 C to 85 C at 25 C X5R Within ± Y5V - 25 C to 85 C at 20 C Y5V Within + 30 %/- 80 % Pressurizing force: 0201: 2N 0402 and 0603: 5 N > 0603: 10 N Test time 10 s ± 1 s Vibration frequency: 10 Hz/min to 55 Hz/min Total amplitude: 1.5 mm Test time: 6 h (2 h each in 3 mutually perpendicular directions) Solder temperature: 235 C ± 5 C Dipping time: 2 s ± 0.5 s or removal of the terminations Capacitance change and Q/DF: to meet initial specification 95 % minimum coverage of all metallized area Revision: 27-Mar-13 2 Document Number: 28545

3 10) Bending test 11) Resistance to soldering heat 12) Temperature cycle The middle part of the substrate shall be pressurized by means of the pressurizing rod at a rate of about 1 mm per s until the deflection becomes 1 mm and then the pressure shall be maintained for 5 s ± 1 s Measurement to be made after keeping at room temperature for Solder temperature: 260 C ± 5 C Dipping time: 10 s ± 1 s Preheating: 120 C to 150 C for 1 min before immerse the capacitor in a eutectic solder Before initial measurement (class 2 only): Perform 150 C + 0 C/ - 10 C for 1 h and then set for at room temperature Measurement to be made after keeping at room temperature for Conduct the 5 cycles according to the temperature and time Step Temperature ( C) Time (min.) 1 Min. operating temp. + 0/ ± 3 2 Room temperature 2 ~ 3 3 Max. operating temp. + 3/ ± 3 4 Room temperature 2 ~ 3 Before initial measurement (class 2 only): Perform 150 C + 0 C/- 10 C for 1 h and then set for at room temperature Measurement to be made after keeping at room temperature for C0G (NP0): within ± 5.0 % or ± 0.5 pf whichever is larger X7R, X5R: within ± 12.5 % Y5V: within ± 30 % (This capacitance change means the change of capacitance under specified flexure of substrate from the capacitance measured before the test) C0G (NP0): within ± 2.5 % or ± 0.25 pf whichever is larger X7R, X5R: within ± 7.5 % Y5V: within ± 20 % Q/DF, I.R. and dielectric strength: To meet initial requirements 25 % maximum leaching on each edge C0G (NP0): within ± 2.5 % or ± 0.25 pf whichever is larger X7R, X5R: within ± 7.5 % Y5V: within ± 20 % Q/DF, I.R. and dielectric strength: To meet initial requirements Revision: 27-Mar-13 3 Document Number: 28545

4 C0G (NP0): within ± 5.0 % or ± 0.5 pf whichever is larger X7R, X5R: 10 V within ± 12.5 %; 6.3 V, within ± 25 % Y5V: 10 V within ± 30 %, 6.3 V within + 30 %/- 40 % Q/DF value: C0G (NP0): more than 30 pf: Q pf C 30 pf: Q C; Less than 10 pf: Q C X5R, X7R: 6 % 0201 (50 V); μf; μf; μF 50 V 3 % 20 % μf; μf; μf; 35 V 5 % 20 % μf; μF μf; μf; 14 % μf; μf μf; μf; μf; μf; 5 % μf; μf; μf; μf; μf; μf; μf; μf; 10 V 7.5 % μf; μf; μf; μf; μf; 20 % μf; μf 13) Humidity (damp heat) steady state Test temperature: 40 C ± 2 C Humidity: 90 % to 95 % RH Test time: 500 h + 24 h/- 0 h Before measurement (class 2 only): Perform 150 C + 0 C/ - 10 C for 1 h and then set for at room temperature Measurement to be made after keeping at room temperature for 6.3 V 30 % μf; μf; μf; μf; μf; μf 4 V 20 % - - Y5V: 50 V 7.5 % μf; μf; μf 35 V V 7.5 % μf; μf; μf; μf; μf; μf; μf; 12.5 % μf; μf 20 % μf μf; μf; 12.5 % 20 % μf; 10 V 20 % 30 % μf 6.3 V 30 % - - I.R.: 10 V: 1 G or R x C 50 F whichever is smaller CLASS 2 (X5R, X7R, Y5V): RATED INSULATION RESISTANCE 50 V: μf; μf; μf; 35 V: μf; 25 V: μf; μf; μf; μf; : μf; μf; μf; μf; μf 10 V: nf; μf; μf; μf; μf; μf 1 G or R x C 10 F Revision: 27-Mar-13 4 Document Number: 28545

5 14) Humidity (damp heat) load Test temperature: 40 C ± 2 C Humidity: 90 % ~ 95 % RH Test time: 500 h + 24 h/- 0 h To apply voltage: rated voltage (max. 500 V) Before initial measurement (class 2 only): Perform 150 C + 0 C/- 10 C for 1h and then set for at room temperature Measurement to be made after keeping at room temperature for C0G (NP0): within± 7.5 % or ± 0.75 pf whichever is larger. X7R, X5R: 10 V within ± 12.5 %; 6.3 V, with ± 25 % Y5V: 10 V within ± 30 %; 6.3 V, within + 30 %/- 40 % Q/DF value: C0G (NP0) Cap 30 pf: Q 200; Cap < 30 pf: Q /3 C X5R, X7R: 50 V 3 % 6 % 0201 (50 V); μf; μf; μf 20 % μf; μf; μf; 35 V 5 % 20 % μf; 5 % μf; μf; 14 % μf; μf Revision: 27-Mar-13 5 Document Number: μf; μf; μf; μf; μf; μf; μf; μF μf; μf; μf; μf; μf; 10 V 7.5 % μf; μf; μf; μf; μf; 20 % μf; μf 6.3 V 30 % μf; μf; μf; μf; μf; μf 4 V 20 % - - Y5V: 50 V 7.5 % μf; μf; μf 35 V V 7.5 % 12.5 % 20 % μf; μf; μf; μf; μf; μf; μf; 12.5 % μf; μf 20 % μf 10 V 20 % 30 % μf 6.3 V 30 % - - I.R.: 10 V: 500 M or 25 F whichever is smaller CLASS 2 (X5R, X7R, Y5V): RATED μf; μf; μf; 50 V: μf; μf; μf; 35 V: μf; 25 V: μf; μf; μf; μf; : μf; μf; μf; μf; μf 10 V: nf; μf; μf; μf; μf; μf INSULATION RESISTANCE 500 M or R x C 5 F

6 15) High temp. load (endurance) Test temperature: C0G (NP0), X7R/X7E: 125 C ± 3 C X5R, Y5V: 85 C ± 3 C To apply voltage: C0G (NP0): ± 3.0 % or ± 0.3 pf whichever is larger. X7R, X5R: 10 V within ± 12.5 %; 6.3 V, with ± 25 % Y5V: 10 V within ± 30 %; 6.3 V, within + 30 % to - 40 % Q/DF value: C0G (NP0): More than 30 pf, Q pf C < 30 pf: Q 275 C C; Less than 10 pf: Q 200 C + 10 C (1.1) 100 % of rated voltage for below range X5R, X7R: SIZE DIELECTRIC RATED CAP. RANGE 0201 X5R/X7R 6.3 V, 10 V C 0.1 μf 6 % 0402 X5R/X7R 6.3 V, 10 V C 1 μf 50 V 3 % 0603 X5R/X7R 6.3 V, 10 V C 4.7 μf 20 % 0201 (50 V); μf; μf; μf μf; μf; μf; 0805 X5R/X7R 6.3 V C 22 μf 35 V 5 % 20 % μf; 1206 X5R/X7R 6.3 V C 47 μf μf; μf; (1.2) 6.3 V or C 10 μf: 150 % of rated voltage 14 % μf; μf (2)10 V U R < 500 V: 200 % of rated voltage μf; μf; μf; μf; 150 % of rated voltage for below range: μf; μf; μf; 5 % SIZE DIELECTRIC CAP μf; μf; μf; RANGE μf; μf; 0402 X5R/X7R 10 V,, μf; μf; μf; C 0.22 μf 25 V 10 V 7.5 % μf; μf; Y5V C 0.47 μf 20 % μf; μf 0603 X5R/X7R 10 V, 6.3 V 30 % μf; μf; μf; μf; μf; μf Y5V C 2.2 μf 4 V 20 % - - X5R/X7R 10 V C 4.7 μf Y5V: 0805 Y5V C 4.7 μf RATED (3) 500 V: 150 % of rated voltage (4) U R 630 V: 120 % of rated voltage 50 V 7.5 % μf; μf; μf Test time: 1000 h + 24 h/- 0 h Before measurement (class 2 only): Perform 150 C + 0 C/- 10 C for 1 h and then set for at room temperature Measurement to be made after keeping at room temperature for 35 V μf; μf; μf; μf; 25 V 7.5 % μf; μf; μf; 12.5 % μf; μf 20 % μf 12.5 % 20 % μf; μf; μf; 10 V 20 % 30 % μf 6.3 V 30 % - - I. R.: 10 V: 1 G or 50 F whichever is smaller CLASS 2 (X5R, X7R, Y5V): RATED INSULATION RESISTANCE 50 V: μf; μf; μf; 35 V: μf; 25 V: μf; μf; μf; μf; : μf; μf; μf; 1 G or R x C 10 F μf; μf 10 V: nf; μf; μf; μf; μf; μf Revision: 27-Mar-13 6 Document Number: 28545

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